Login / Signup

Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits.

Huy NguyenRabindra K. RoyAbhijit Chatterjee
Published in: VLSI Design (1998)
Keyphrases
  • built in self test
  • high speed
  • artificial intelligence
  • pattern matching
  • databases
  • statistical methods
  • uniformly distributed
  • asynchronous circuits
  • data mining
  • partial information
  • shift register