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Investigations of AlGaN/GaN field-effect transistor structures by photoreflectance spectroscopy.

J. MisiewiczR. KudrawiecM. SyperekR. PaszkiewiczB. PaszkiewiczM. Tlaczala
Published in: Microelectron. J. (2005)
Keyphrases
  • field effect transistors
  • steady state
  • high density
  • mathematical analysis
  • schottky barrier
  • x ray
  • real time
  • machine learning
  • database systems
  • databases
  • search space
  • image analysis
  • dynamic programming
  • infrared