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A Direct-Sampling Pulsed Time-of-Flight Radar With Frequency-Defined Vernier Digital-to-Time Converter in 65 nm CMOS.
Yu-Hsien Kao
Ta-Shun Chu
Published in:
IEEE J. Solid State Circuits (2015)
Keyphrases
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time of flight
metal oxide semiconductor
depth map
infrared
depth information
analog to digital converter
data conversion
low voltage
low cost
high speed
tof camera
high resolution
ccd camera
range data
high accuracy
cmos technology
depth images
transfer function
control method
cmos image sensor
image processing