Login / Signup
Effect of gate engineering in double-gate MOSFETs for analog/RF applications.
Angsuman Sarkar
Aloke Kumar Das
Swapnadip De
Chandan Kumar Sarkar
Published in:
Microelectron. J. (2012)
Keyphrases
</>
nano scale
leakage current
low voltage
multiple input
artificial intelligence
expert systems
software engineering
machine learning
e learning
multiresolution
engineering design
computer aided design