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SCRAP: Sequential circuits reliability analysis program.

Seyyed Javad Seyyed MahdaviKarim Mohammadi
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • reliability analysis
  • neural network
  • fault tree
  • artificial neural networks
  • condition monitoring
  • real world
  • artificial intelligence
  • decision making
  • relational databases
  • rough sets
  • delay insensitive