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A multiple heterogeneous kernel RVM approach for analog circuit fault prognostic.

Chaolong ZhangYigang HeLifen YuanSheng Xiang
Published in: Clust. Comput. (2019)
Keyphrases
  • fault diagnosis
  • analog circuits
  • feature space
  • decision making
  • neural network
  • multiresolution
  • fault detection
  • expert systems
  • kernel methods