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Multiple-field approach for aberration correction in miniature imaging systems based on wafer-level production.
Eric Logean
Toralf Scharf
Nicolas Bongard
Hans Peter Herzig
Markus Rossi
Published in:
Multimedia Content and Mobile Devices (2013)
Keyphrases
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imaging systems
machine vision
image formation
semiconductor manufacturing
integrated circuit
stereo images
wide field of view
computer vision
three dimensional
denoising
signal processing
camera calibration
production cost
manufacturing process