Evidence of chlorine ion penetration in InP/InAsP quantum well structures during dry etching processes and effects of induced-defects on the electronic and structural behaviour.
Jean-Pierre LandesmanChristophe LevalloisJuan JiménezFrédéric PommereauYoan LégerAlexandre BeckThomas DelhayeAlfredo TorresCesare FrigeriAhmed RhallabiPublished in: Microelectron. Reliab. (2015)
Keyphrases
- magnetic recording
- structural analysis
- structural models
- structural features
- empirical evidence
- structural information
- quantum inspired
- quantum computing
- information technology
- quantum computation
- high density
- data sets
- field effect transistors
- qualitative models
- defect classification
- channel capacity
- cognitive functions
- belief functions
- integrated circuit
- computer simulation
- neural network