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How to automate millions lines of top-level UVM testbench and handle huge register classes.
Namdo Kim
Young-Nam Yun
Young-Rae Cho
Jay B. Kim
Byeong Min
Published in:
ISOCC (2012)
Keyphrases
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straight line
artificial intelligence
huge number
database
real world
face recognition
training data
expert systems
hough transform
line drawings
lower level
tens of thousands