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Byeong Min
Publication Activity (10 Years)
Years Active: 2000-2012
Publications (10 Years): 0
Top Topics
Levels Of Abstraction
Leaf Nodes
Open Issues
Huge Number
Top Venues
ISOCC
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Publications
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Namdo Kim
,
Young-Nam Yun
,
Young-Rae Cho
,
Jay B. Kim
,
Byeong Min
How to automate millions lines of top-level UVM testbench and handle huge register classes.
ISOCC
(2012)
Youngchan Lee
,
Namdo Kim
,
Jay B. Kim
,
Byeong Min
Millions to thousands issues through knowledge based SoC CDC verification.
ISOCC
(2012)
DaeSeo Cha
,
HyunWoo Koh
,
NamPhil Jo
,
Jay B. Kim
,
Byeong Min
,
Karthik Kothandapani
,
Riccardo Oddone
,
Adam D. Sherer
Verification of massive advanced node SoCs.
ISOCC
(2012)
Kyuho Shim
,
Woojoo Kim
,
Kwang-Hyun Cho
,
Byeong Min
System-level simulation acceleration for architectural performance analysis using hybrid virtual platform system.
ISOCC
(2012)
Sik Kim
,
Kwang-Hyun Cho
,
Byeong Min
An efficient GPIO block design methodology using formalized SFR description.
ISOCC
(2011)
Young-Nam Yun
,
Jae-Beom Kim
,
Nam-Do Kim
,
Byeong Min
Beyond UVM for practical SoC verification.
ISOCC
(2011)
Woo-Cheol Kwon
,
Sung-Min Hong
,
Sungjoo Yoo
,
Byeong Min
,
Kyu-Myung Choi
,
Soo-Kwan Eo
An Open-Loop Flow Control Scheme Based on the Accurate Global Information of On-Chip Communication.
DATE
(2008)
Woo-Cheol Kwon
,
Sungjoo Yoo
,
Sung-Min Hong
,
Byeong Min
,
Kyu-Myung Choi
,
Soo-Kwan Eo
A practical approach of memory access parallelization to exploit multiple off-chip DDR memories.
DAC
(2008)
Byeong Min
,
Gwan Choi
ECC: Extended Condition Coverage for Design Verification Using Excitation and Observation.
PRDC
(2001)
Zan Yang
,
Byeong Min
,
Gwan Choi
Simulation Using Code-Perturbation: Black- and White-Box Approach.
ISQED
(2001)
Byeong Min
,
Gwan Choi
RTL functional verification using excitation and observation coverage.
HLDVT
(2001)
Zan Yang
,
Byeong Min
,
Gwan Choi
Si-emulation: system verification using simulation and emulation.
ITC
(2000)
Byeong Min
,
Gwan Choi
Verification Simulation Acceleration Using Code-Perturbation.
J. Electron. Test.
16 (1-2) (2000)