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Advanced analysis on board trace reliability of WLCSP under drop impact.

Ahmer SyedTong Yan TeeHun Shen NgRex AndersonChoong Peng KhooBoyd Rogers
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • artificial intelligence
  • relational databases
  • real time
  • neural network
  • data mining
  • search engine
  • image processing
  • statistical analysis
  • wireless networks
  • automatic analysis
  • high impact