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Development of an RF IV waveform based stress test procedure for use on GaN HFETs.

William McGennMichael J. UrenJohannes BenediktPaul J. Tasker
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • software engineering
  • relevance feedback
  • data sets
  • data mining
  • software testing
  • real world
  • multiscale
  • input image
  • test cases
  • development process
  • rapid development
  • st century
  • statistical significance