Login / Signup
Development of an RF IV waveform based stress test procedure for use on GaN HFETs.
William McGenn
Michael J. Uren
Johannes Benedikt
Paul J. Tasker
Published in:
Microelectron. Reliab. (2012)
Keyphrases
</>
software engineering
relevance feedback
data sets
data mining
software testing
real world
multiscale
input image
test cases
development process
rapid development
st century
statistical significance