Wafer-Level Die Re-Test Success Prediction Using Machine Learning.
Hardi SelgMaksim JenihhinPeeter EllerveePublished in: LATS (2020)
Keyphrases
- machine learning
- computer vision
- prediction accuracy
- artificial intelligence
- prediction algorithm
- natural language processing
- learning tasks
- machine learning methods
- prediction model
- levels of abstraction
- test cases
- computational intelligence
- massively parallel
- natural language
- feature selection
- data mining
- machine learning approaches
- integrated circuit
- prediction error
- semiconductor manufacturing
- predictive modeling
- inductive learning
- data sets
- inductive logic programming
- learning systems
- semi supervised learning
- supervised learning
- information extraction
- artificial neural networks
- training set
- expert systems
- reinforcement learning
- decision trees
- information systems