Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method.
Yuxin TianMichael R. GrimailaWeiping ShiM. Ray MercerPublished in: Asian Test Symposium (2003)
Keyphrases
- dynamic programming
- linear programming
- computational cost
- high accuracy
- high precision
- test data
- preprocessing
- weighting coefficients
- genetic algorithm
- optimization method
- synthetic data
- detection method
- clustering method
- support vector machine
- classification accuracy
- cost function
- computational complexity
- objective function
- support vector machine svm
- experimental evaluation
- significant improvement
- classification method
- closed form
- similarity measure
- exhaustive search
- statistical significance
- fine tuning
- selection scheme
- learning algorithm