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Utilizing Circuit Structure for Scan Chain Diagnosis.
Wei-Hen Lo
Ang-Chih Hsieh
Chien-Ming Lan
Min-Hsien Lin
TingTing Hwang
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
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graph structure
machine learning
high speed
fault diagnosis
image processing
medical diagnosis
real time
artificial intelligence
knowledge base
multiscale
computer aided
structural properties
diagnostic reasoning
automatic diagnosis