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The Reverse Recovery Characteristics of an Improved 3.3-kV CIBH Diode with Local Heavily Doped N++ Regions at the Cathode.

Kai ZhaoYu WuYueyang LiuXintian ZhouZhaomin YaoYingying Lei
Published in: EITCE (2021)
Keyphrases
  • transmission line
  • computer simulation
  • image regions
  • real time
  • input image
  • three dimensional
  • region of interest
  • image pixels
  • salient features
  • electron beam
  • room temperature