A Heuristic Algorithm for the Testing of Asynchronous Circuits.

Gianfranco R. Putzolu J. Paul Roth

Published in: IEEE Trans. Computers (1971)

Keyphrases

asynchronous circuits
delay insensitive
process algebra
model checking
neural network
test cases
software testing
real time
machine learning
database
computer vision
information systems
decision making
multiresolution
object oriented
test data