Improving Semantic Embedding Consistency by Metric Learning for Zero-Shot Classiffication.

Maxime Bucher Stéphane Herbin Frédéric Jurie

Published in: ECCV (5) (2016)

Keyphrases

metric learning
maximum variance unfolding
distance metric
distance metric learning
machine learning and pattern recognition
dimensionality reduction
pairwise

semi supervised
nonlinear dimensionality reduction
learning tasks
multi task
semi supervised clustering
semi supervised learning

feature space
distance function
semantic information
mahalanobis metric
machine learning
subject to linear constraints

labeled data
image classification
domain knowledge
object recognition
neural network
data sets