On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits.
Junwu ZhangMichael L. BushnellVishwani D. AgrawalPublished in: ITC (2004)
Keyphrases
- preprocessing
- randomly generated
- optimal solution
- pattern generation
- similarity measure
- np hard
- computational complexity
- optimization algorithm
- worst case
- computational cost
- recognition algorithm
- experimental evaluation
- cost function
- data sets
- high speed
- particle swarm optimization
- expectation maximization
- detection algorithm
- gene expression
- times faster
- k means
- clustering algorithm
- dynamic programming
- microarray
- objective function