Kernel enhanced multilayer perceptron for industrial process diagnosis.
Lucas H. Sousa MelloFlávio Miguel VarejãoThomas W. RauberPublished in: IJCNN (2012)
Keyphrases
- multilayer perceptron
- industrial process
- industrial processes
- fault detection
- neural network
- back propagation
- artificial neural networks
- radial basis function
- neural network model
- hidden layer
- input vector
- fault diagnosis
- support vector
- feature space
- probabilistic neural networks
- modular neural network
- activation function
- quality improvement
- backpropagation algorithm
- bp neural network
- knowledge base
- feature selection