Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs.
Chen-Wei LinMango Chia-Tso ChaoChih-Chieh HsuPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
- mathematical model
- probabilistic model
- statistical model
- test data
- theoretical analysis
- similarity measure
- reconstruction method
- cost function
- classification method
- hybrid model
- prediction model
- parameter estimation
- objective function
- input data
- network model
- significant improvement
- bayesian framework
- prior knowledge
- energy function
- sensitivity analysis
- linear regression
- regression analysis
- bp neural network
- recognition algorithm
- clustering method
- parameter space
- optimization method
- evaluation method
- neural network
- pairwise
- autoregressive
- classification algorithm
- study proposes
- tree structure
- modeling method