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DfT schemes for resistive open defects in RRAMs.

Nor Zaidi HaronSaid Hamdioui
Published in: DATE (2012)
Keyphrases
  • frequency domain
  • defect classification
  • discrete fourier transform
  • defect detection
  • real time
  • neural network
  • three dimensional
  • preprocessing
  • special case
  • fourier transform
  • allocation scheme