WaferCap: Open Classification of Wafer Map Patterns using Deep Capsule Network.
Abhishek MishraMohammad Ershad ShaikAnush LingamoorthySuman KumarAnup DasNagarajan KandasamyNur A. ToubaPublished in: VTS (2024)
Keyphrases
- pattern recognition
- support vector
- automatic classification
- classification accuracy
- feature extraction
- lung disease
- feature space
- pattern classification
- classification models
- pattern analysis
- supervised learning
- support vector machine
- input patterns
- feature vectors
- pattern representation
- communication patterns
- radial basis function network
- massively parallel
- integrated circuit
- pattern discovery
- frequent patterns
- region of interest
- network structure
- classification algorithm
- data sets
- support vector machine svm
- unsupervised learning
- data mining techniques
- peer to peer
- active learning
- feature selection
- machine learning