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Robust and In-Situ Self-Testing Technique for Monitoring Device Aging Effects in Pipeline Circuits.

Jiangyi LiMingoo Seok
Published in: DAC (2014)
Keyphrases
  • real time
  • decision support
  • computationally efficient
  • monitoring system
  • data acquisition
  • high speed
  • early warning
  • data sets
  • statistical tests
  • force feedback
  • software aging
  • tunnel diode