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Testing complex couplings in multiport memories.
Michael Nicolaidis
Vladimir Castro Alves
Hakim Bederr
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (1995)
Keyphrases
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highly complex
expert systems
complex systems
higher level
data structure
computationally intensive
test cases
real time
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wide range
optimal solution
relational databases
bayesian networks
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complex data
machine learning