Electromagnetic Induced Failure in GaN-HEMT High-Frequency Power Amplifier.
Vivek SangwanCher Ming TanDipesh KapoorHsien-Chin ChiuPublished in: IEEE Trans. Ind. Electron. (2020)
Keyphrases
- high frequency
- high power
- low frequency
- power supply
- visual quality
- high resolution
- subband
- low pass
- high frequencies
- wavelet transform
- wavelet coefficients
- power consumption
- frequency band
- wavelet domain
- low power
- structuring elements
- discrete wavelet transform
- wavelet decomposition
- human visual system
- image quality
- multiresolution
- multi resolution analysis
- phase shifting
- feature extraction
- input image
- high frequency components
- computational complexity