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TCAD degradation modeling for LDMOS transistors.

Susanna ReggianiGaetano BaroneElena GnaniAntonio GnudiS. PoliM.-Y. ChuangW. TianR. Wise
Published in: ESSDERC (2012)
Keyphrases
  • power consumption
  • modeling method
  • neural network
  • case study
  • information systems
  • multiresolution
  • computer aided design