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Antiferromagnetic Films and Their Applications.
Atsufumi Hirohata
David C. Lloyd
Takahide Kubota
Takeshi Seki
Koki Takanashi
Hiroaki Sukegawa
Zhenchao Wen
Seiji Mitani
Hiroki Koizumi
Published in:
IEEE Access (2023)
Keyphrases
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grain size
ni fe
image processing
film restoration
electron micrographs
real time
computer vision
feature selection
high quality
viewpoint
evolutionary algorithm
multiresolution