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An automatic defect detection method for TO56 semiconductor laser using deep convolutional neural network.
Hang Zhang
Rong Li
Dexiang Zou
Jian Liu
Ning Chen
Published in:
Comput. Ind. Eng. (2023)
Keyphrases
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detection method
convolutional neural network
face detection
detection algorithm
detection rate
detection accuracy
feature detection
skin color
neural network
region detection
human faces
complex background
feature extraction
video sequences
image restoration
computer vision
machine learning