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Single bit-line 8T SRAM cell with asynchronous dual word-line control for bit-interleaved ultra-low voltage operation.

Chi-Ray HuangLih-Yih Chiou
Published in: IET Circuits Devices Syst. (2018)
Keyphrases
  • random access memory
  • low voltage
  • shift register
  • design considerations
  • power line
  • low cost
  • high speed