A fast reliability assessment method for Si MEMS based microcantilever beams.
Peyman RafieeGolta KhatibiPublished in: Microelectron. Reliab. (2014)
Keyphrases
- high precision
- reliability assessment
- pairwise
- preprocessing
- multiresolution
- detection method
- support vector machine svm
- theoretical analysis
- model selection
- classification method
- power system
- synthetic data
- detection algorithm
- computationally efficient
- image processing
- high accuracy
- computational cost
- prior knowledge
- video sequences
- objective function
- multiscale