• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

A Case Study in Using Discrete-Event Simulation to Improve the Scalability of MG-RAST.

Caitlin RossMisbah MubarakJohn JenkinsPhilip H. CarnsChristopher D. CarothersRobert B. RossWei TangWolfgang GerlachFolker Meyer
Published in: SIGSIM-PADS (2016)
Keyphrases
  • discrete event simulation
  • case study
  • semiconductor manufacturing
  • lower bound
  • supervised learning
  • scalability issues