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A Case Study in Using Discrete-Event Simulation to Improve the Scalability of MG-RAST.

Caitlin RossMisbah MubarakJohn JenkinsPhilip H. CarnsChristopher D. CarothersRobert B. RossWei TangWolfgang GerlachFolker Meyer
Published in: SIGSIM-PADS (2016)
Keyphrases
  • discrete event simulation
  • case study
  • semiconductor manufacturing
  • lower bound
  • supervised learning
  • scalability issues