Login / Signup
A Case Study in Using Discrete-Event Simulation to Improve the Scalability of MG-RAST.
Caitlin Ross
Misbah Mubarak
John Jenkins
Philip H. Carns
Christopher D. Carothers
Robert B. Ross
Wei Tang
Wolfgang Gerlach
Folker Meyer
Published in:
SIGSIM-PADS (2016)
Keyphrases
</>
discrete event simulation
case study
semiconductor manufacturing
lower bound
supervised learning
scalability issues