Login / Signup
Evaluation of conductive-to-resistive layers interaction in thick-film resistors.
K. Mleczko
Z. Zawislak
Adam Witold Stadler
Andrzej Kolek
Andrzej Dziedzic
J. Cichosz
Published in:
Microelectron. Reliab. (2008)
Keyphrases
</>
human computer interaction
real time
image processing
human interaction
computer vision
data structure
user interface
neural network
data mining
image segmentation
user interaction
empirical evaluation
evaluation criteria
gold standard
comparative evaluation
multiple layers