Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits.

Mitiko Miura-Mattausch Hidenori Miyamoto Hideyuki Kikuchihara Dondee Navarro Tapas K. Maiti Nezam Rohbani C. Ma Hans Jürgen Mattausch A. Schiffmann Alexander Steinmair Ehrenfried Seebacher

Published in: ESSDERC (2017)

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