The Timed Abstract State Machine Based Test Data Auto Generation for Embedded Systems.
Zhexi YaoTao ZhangJinbo WangPublished in: DSA (2017)
Keyphrases
- test data
- embedded systems
- state machine
- state machines
- finite state machines
- petri net
- low cost
- computing power
- real time systems
- training data
- embedded devices
- embedded software
- test cases
- test set
- fault tolerant
- resource limited
- training set
- embedded real time systems
- software systems
- field programmable gate array
- data sets
- training and test data
- hardware software
- hw sw
- model checking
- case study
- databases
- real time
- training samples
- generation algorithm
- flash memory
- relational databases
- high level
- search based testing