Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting Codes.
Len LevineWare MyersPublished in: Computer (1976)
Keyphrases
- error detection
- error correction
- error rate
- failure rate
- computing power
- data sets
- database
- feature vectors
- error correcting
- memory usage
- confidence levels
- error control
- semiconductor manufacturing
- highly reliable
- memory space
- error analysis
- generalization error
- memory requirements
- error bounds
- image retrieval
- feature space