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Low Leakage Current Nb-Based Tunnel Junctions with an Extra Top Al Layer.

Mizuki IkeyaTakashi NoguchiTakafumi KojimaTakeshi Sakai
Published in: IEICE Trans. Electron. (2017)
Keyphrases
  • silicon dioxide
  • leakage current
  • image processing
  • naive bayes
  • multi layer
  • high speed
  • real time
  • naive bayesian
  • decision trees
  • moving objects
  • digital images
  • simulation model
  • hardware and software