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Efficient Statistical Analysis for Correlated Rare Failure Events via Asymptotic Probability Approximation.
Fulin Peng
Handi Yu
Jun Tao
Yangfeng Su
Dian Zhou
Xuan Zeng
Xin Li
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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statistical analysis
closed form
efficient computation
computationally expensive
event recognition
approximation error
rare events
data structure
probability distribution
lightweight
failure rate
statistical analyses
randomized algorithm
central limit theorem