Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE.
Masayuki KawabataKoji AsamiShohei ShibuyaTomonori YanagidaHaruo KobayashiPublished in: ITC-Asia (2017)
Keyphrases
- mixed signal
- low power
- vlsi circuits
- multi channel
- cmos technology
- digital circuits
- high speed
- power consumption
- low cost
- low voltage
- low signal to noise ratio
- signal processing
- noise ratio
- analog circuits
- real time
- single chip
- duty cycle
- model based diagnosis
- digital signal processing
- circuit design
- data flow
- parallel processing
- frequency domain
- image processing
- computer vision