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A New Architecture for Charge Pump Circuit Without Suffering Gate-Oxide Reliability in Low-Voltage CMOS Processes.
Tzu-Ming Wang
Wan-Yi Shen
Ming-Dou Ker
Published in:
ICECS (2007)
Keyphrases
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low voltage
cmos technology
leakage current
design considerations
low power
power consumption
power line
power management
parallel processing
random access memory
low cost
mixed signal
image sensor
high speed
power dissipation
steady state
nm technology
real time
digital camera