Improved Yield Model for Submicron Domain.

Witold A. Pleskacz Wojciech Maly

Published in: DFT (1997)

Keyphrases

formal model
high level
cost function
probabilistic model
probability distribution
theoretical analysis
neural network model
em algorithm
prediction model
database
conceptual model
experimental data
computational model
parameter estimation
video sequences
e learning
artificial intelligence
information retrieval