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Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits.

Brett SparkmanScott C. SmithJia Di
Published in: VTS (2020)
Keyphrases
  • asynchronous circuits
  • delay insensitive
  • built in self test
  • process algebra
  • model checking
  • data sets
  • integrated circuit
  • database
  • real time
  • logic programs
  • theorem proving
  • adaptive threshold