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Design and analysis of piezoelectric cantilevers with enhanced higher eigenmodes for atomic force microscopy.

Steven Ian MooreMichael G. RuppertYuen Kuan Yong
Published in: AIM (2017)
Keyphrases
  • data analysis
  • statistical analysis
  • atomic force microscopy
  • neural network
  • building blocks
  • design decisions
  • database
  • data mining
  • case study
  • knowledge based systems