Design for Two-Pattern Testability of Controller-Data Path Circuits.

Atlaf Ul Amin Satoshi Ohtake Hideo Fujiwara

Published in: Asian Test Symposium (2002)

Keyphrases

data analysis
data sets
raw data
data processing
input data
database
training data
data structure
small number
databases
statistical analysis
pattern matching
data distribution
xml documents
data sources
data points
knowledge discovery
case study
computer systems
high dimensional data
experimental data