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Design of a Practical Nanometer-Scale Redundant Via-Aware Standard Cell Library for Improved Redundant Via1 Insertion Rate.
Tsang-Chi Kan
Shih-Hsien Yang
Ting-Feng Chang
Shanq-Jang Ruan
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
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building blocks
case study
design process
scale space
practical application
design decisions
data mining
three dimensional
high level
expert systems
knowledge based systems
computer aided
small scale
design tools
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