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Integration of dual channel timing formatter system for high speed memory test equipment.

Jaeseok ParkIngeol LeeYoung-Seok ParkSung-Geun KimKyungho RyuDong-Hoon JungKangwook JoChoong Keun LeeHongil YoonSeong-Ook JungWoo-Young ChoiSungho Kang
Published in: ISOCC (2012)
Keyphrases
  • high speed
  • dual channel
  • real time
  • low power
  • memory size
  • data fusion
  • memory requirements
  • computing power
  • memory space
  • data sets
  • decision making
  • knowledge base
  • clustering algorithm
  • bayesian networks
  • statistical tests