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A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates.
Víctor H. Champac
Freddy Forero
Michel Renovell
Leonardo Miceli
Published in:
LATS (2023)
Keyphrases
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objective function
theoretical framework
computational model
statistical model
probabilistic model
mathematical model
hierarchical structure
real time
learning algorithm
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neural network model
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