A concurrent error detection IC in 2-μm static CMOS logic.
Jien-Chung LoShih-Yao SunJames C. DalyPublished in: IEEE J. Solid State Circuits (1994)
Keyphrases
- error detection
- error correction
- delay insensitive
- error recovery
- fault isolation
- data cleansing
- fault tolerance
- error correcting
- random access memory
- power consumption
- error resilient
- low cost
- modal logic
- integrated circuit
- asynchronous circuits
- high speed
- chip design
- analog vlsi
- concurrent programming
- power supply
- low power
- error control
- low voltage
- fault tolerant
- logic programming
- sensor networks