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Probability-Based Optimal Sizing of Power-Gating Transistors in Full Adders for Reduced Leakage and High Performance.
Pradeep S. Nair
Savithra Eratne
Eugene B. John
Published in:
J. Low Power Electron. (2012)
Keyphrases
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power consumption
low power
probability distribution
closed form
optimal control
optimal design
high power
real time
high efficiency
integrated circuit
high density
multiple valued