Atomic Force Microscopy control system for electrostatic measurements based on mechanical and electrical modulation.
Sergey BelikovJohn AlexanderSergei MagonovIvan YermolenkoPublished in: ACC (2012)
Keyphrases
- control system
- atomic force microscopy
- electro mechanical
- dc motor
- closed loop
- fuzzy logic
- mechanical design
- electrical power
- control strategy
- control algorithm
- process control
- control method
- speed control
- pid controller
- control scheme
- transmission line
- modulation scheme
- measurement noise
- data sets
- power grid
- real time
- ofdm system
- electric field
- physical characteristics
- computer engineering
- measured data
- electrical activity
- steady state
- virtual environment
- neural network